ON EXPERIENCES WITH AN IMAGE PLATE DETECTOR COMBINED WITH A SINGLE CRYSTAL DIFFRACTOMETER. Huber. Th., Lange, J., Burzlaff, H., Institut für Angewandte Physik, Lehrstuhl für Kristallographie, Universität Erlangen-Nürnberg, Bismarckstraße 10, 91054 Erlangen, Germany, Thoms, M., Winnacker A., Institut für Werkstoffwissenschaften, Universität Erlangen-Nürnberg, Martensstraße 7, 91058 Erlangen, Germany

Most of image plate devices make use of rotation or oscillation techniques. In our system the combination of a modified three circle diffractometer originally used for Laue-techniques [1] is combined with the image plate [2]. The detector system is presented separately. The diffractometer consists of an [[omega]]-2J-base with an additional d-axis for the crystal. This axis is inclined by 30deg. against the [[omega]]-axis, thus allowing full investigation of the reciprocal lattice. Several crystal structures already determined with a normal four-circle instrument are remeasured with the new device. The results will be compared and further experiences will be reported.

[1]Lange, J. and Burzlaff, H.: Single-Crystal Data Collection with a Laue Diffractometer. Acta Cryst. A51 (1995), 931-936.

[2]Thoms, M., Burzlaff, H., Kinne, A., Lange, J., Von Seggern, H., Spengler, R., Winnacker, A.: An improved X-ray image plate detector for diffractometry, Proc. of the EPDIC IV, Chester (1995).