Event Name

Advanced X-ray Microanalysis by EDS

Start Date 15th Jul 2014
End Date 17th Jul 2014

This is an advanced course in X-ray microanalysis using energy-dispersive x-ray spectrometry (EDS). The prerequisite is successful completion of INS-510: Scanning Electron Microscopy or an equivalent level of experience. The course will provide instruction and hands-on practice on performing EDS, analyzing difficult samples, mapping, and interpreting analysis results.

Course outline

  • Brief review of the theory of X-ray generation
  • Optimizing X-ray detection
  • Qualitative X-ray strategies for difficult samples
  • Performing matrix correction and quantitative analysis
  • Elemental line profiling and spectral imaging
  • Interpreting EDS data
Location Westmont, IL
United States
URL http://www.hookecollege.com/courses/course.asp?COURSE_ID=129

Category Training courses
Topics Microscopy | X-ray optics and imaging