Event Name

X-ray Nanoimaging: Instruments and Methods III

Start Date 6th Aug 2017
End Date 10th Aug 2017

Conference OP316

X-ray Nanoimaging: Instruments and Methods III

Important Dates

  • Abstract Due: 23 January 2017
  • Author Notification: 3 April 2017
  • Manuscript Due Date: 10 July 2017

Conference Committee

Conference Chairs

Program Committee

  • Yong S. Chu, Brookhaven National Lab. (United States)
  • Michael Feser, Lyncean Technologies, Inc. (United States)
  • Hans M. Hertz, Royal Institute of Technology (Sweden)
  • Ian McNulty, Argonne National Lab. (United States)
  • David Paterson, Australian Synchrotron (Australia)
  • Christian G. Schroer, DESY, Univ. of Hamburg (Germany)
  • Kazuto Yamauchi, Osaka Univ. (Japan)

Call for Papers

In recent years, both synchrotron and laboratory-based facilities have witnessed astounding progress in hard x-ray nanoimaging instruments and methods. Nanoprobes with sub-100-nm resolution have proliferated, while imaging with 1-nm spatial resolution may soon become possible. Combination and correlation with other analytical techniques such as x-ray spectroscopy, diffraction, tomography, ptychography, in-situ environment, and other methods are solving more important questions than ever. 

This conference will focus on the latest developments in optics, instrumentation and systems, data science, and integration with other techniques, for both scanning and full-field x-ray microscopes, including:
  • nanoprobes, full-field microscopes, and dedicated beamlines
  • high-resolution nanofocusing optics
  • instruments for nanoimaging and nanopositioning
  • in-situ and operando sample environments
  • data science and data management
  • novel nanoimaging methods and correlative techniques
  • advanced control or detection schemes.
Location San Diego
United States
URL http://spie.org/OPO/conferencedetails/x-ray-nanoimaging

Category Conferences
Topics Data analysis | Nanomaterials | X-ray optics and imaging | X-ray spectroscopy