Event Name

XTOP 2016 – 13th Biennial Conference on High-Resolution X-Ray Diffraction and Imaging

Start Date 4th Sep 2016
End Date 8th Sep 2016
Description

Scientific programme

Methods and techniques:

  • High resolution diffraction and topography
  • X-ray reflectometry and small-angle scattering
  • Microdiffraction and nanodiffraction
  • Coherent diffraction imaging
  • Absorption and phase contrast imaging and tomography
  • Resonant (anomalous) scattering
  • Fluorescence imaging
  • Time resolved methods
  • Theory and simulations of X-ray scattering

Applications:

  • Material science (from 0D to 3D objects)
  • Nanomaterials and nanoscience
  • Life and environmental sciences
  • Non-destructive testing (including industrial needs and cultural heritage)

Instrumentation:

  • X-ray optics and instrumentation
  • Advances in laboratory instrumentation and applications
  • Advances in synchrotron instrumentation and applications
  • Experiments at X-ray free-electron lasers
Location Brno
Czech Republic
Contact
URL http://xtop2016.sci.muni.cz/
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Category Conferences
Topics Art and history | Free-electron laser | General | Materials | Nanomaterials | Small-angle scattering | Synchrotron radiation | Topography | X-ray optics and imaging