Event Name

7th Telematic School: Structural Analysis by X-ray Diffraction and Contributions of Total Diffusion to Structure Determination

Start Date 3rd Jul 2017
End Date 7th Jul 2017
Description

This school will focus on the basics of of crystalline structure determination, by use of X-ray diffraction, and on the relevant refinement and analysis methods used in such determination.

The primary languages of the school are both English and French.

Registration deadline: 10th June 2017.

For more information and registration, visit:

http://crm2.univ-lorraine.fr/lab/fr/education/congres/nancy2017/informations-generales/

Location Nancy
France
Contact Enrique Espinosa
enrique.espinosa@univ-lorraine.fr
URL http://crm2.univ-lorraine.fr/lab/fr/education/congres/nancy2017/
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Category Schools
Topics Data analysis | General | Small-angle scattering