Event Name

Maud school on combined analysis

Start Date 19th Oct 2015
End Date 23rd Oct 2015
Description

This international school will cover many aspects of the “Combined Analysis” by X-ray, neutron and electron scattering and X-ray fluorescence applied to material science, ranging from fundamental requirements to technically relevant industrial and academic applications. The combined analysis method has been developed over the years starting from the Rietveld method, extending it to most of the powder diffraction analyses and more recently incorporating, on the same idea, other techniques such as reflectivity, X-ray fluorescence and electron diffraction.

Location Trento
Italy
Contact Luca Lutterotti
luca.lutterotti@ing.unitn.it
URL http://maud.radiographema.com/
iCal


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Category Schools
Topics Electron crystallography | Powder diffraction | X-ray fluorescence