Event Name

Symposium R on X-ray Techniques for Advanced Materials, Nanostructures and Thin Films - From Laboratory Sources to Synchrotron Radiation

Start Date 8th Jun 2009
End Date 12th Jun 2009
The purpose of this symposium is to bring together materials scientists and specialists in x-ray and synchrotron radiation (SR) techniques to discuss new opportunities and recent developments. Emphasis will be put on advanced materials, nanostructures and thin films, new techniques, and cross-disciplinary studies. Attention will be given to the role of techniques in the study of materials’ issues in the field of energy and environment.


X-ray techniques have increasing impact on the characterization of advanced materials, nanostructures, and thin films. In both laboratory-based instrumentation and synchrotron radiation, the sophistication and resolution of these methods has flourished. The sheer speed of progress and the present and future availability of advanced facilities make this an appropriate time to hold a workshop, the objective of which is to promote and encourage the interaction between scientists working on different aspects of X-ray characterisation and materials development, in order to address common challenges and to improve existing and novel techniques.

The topics covered include the materials microstructure; a field in which x-ray diffraction and subsequent line profile analysis is the only non-destructive technique, giving estimates of crystallite size, size distribution function, defects and microstrains. All these factors have a large impact on materials functionality. Moreover, x-ray diffraction has become one of the most powerful tools to study the structural properties of nanocomposites, which nowadays receive a great interest for their numerous potential applications. Texture and residual stress both introduce a pronounced anisotropy in the properties of polycrystals. The physical causes for these phenomena are intensively under discussion in the community, and offer a pathway to improve our understanding of materials processing.

The availability of micron and sub-micron beams makes both micro-diffraction and nano-spectroscopy with unprecedented resolution possible, important in many industrial and environmental issues. Furthermore, such small beams allow one to probe very small sample volumes under extreme conditions of pressure and temperature. The coherence of synchrotron x-ray beams enables an easy use of phase sensitive techniques. Phase contrast imaging is providing new insight in structures which have limited, or similar, absorption contrast. The development of fast 3D imaging techniques allows real time experiments for example in the field of metal solidification. Diffraction based imaging gives access to 3D crystallographic arrangements of grains in undeformed materials opening vast avenues of research. Full control of photon beam polarization has allowed the development of dichroism techniques, which are providing new information on magnetic materials. Established techniques such as photoemission, absorption, and diffraction are taking advantage of the properties of third generation sources, by improving resolution and detection limits (e.g. in fluorescence X-ray absorption or trace element analysis applied to impurities, defects, dopants and surfaces). 

The proceedings of the symposium will be published in a special issue of Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms.
Location Strasbourg
URL http://www.emrs-strasbourg.com/index.php?option=com_content&task=view&Itemid=105&id=272&PHPSESSID=ed38cae52d836f3f843ffa94b84953bb

Category IUCr sponsored meetings | Symposia
Topics Materials | Synchrotron radiation