Event Name

X-ray Techniques for Materials Research - From Laboratory Sources to Free Electron Lasers

Start Date 9th May 2011
End Date 13th May 2011
The symposium intends to bridge the gap between the available modern X-ray techniques and innovative materials research and it aims to foster the dialogue between the two communities. The active participation of many scientists and the high number of contributions to the previous edition of the symposium have demonstrated the great demand for such a forum within materials sciences.


Great progress is currently being made in the application of X-ray methods to materials science due to an improved control of the space-time structure of the probing X-ray photons and the development of sophisticated experimental set-ups and data analysis schemes. Ever decreasing small areas like single grains from a polycrystal sample may be investigated by beam sizes in the ┬Ám range and below. Also studies on thin film growth, chemical reaction kinetics and other dynamical processes have become possible thanks to the availability of time-resolved radiation facilities. Great progress in source characteristics and X-ray instrumentation has enabled a new level in the quality of research.

Materials microstructure: X-ray diffraction and subsequent line profile analysis is the only non-destructive technique giving estimates of crystallite size, size distribution function, defects and microstrains; these all have a large impact on materials functionality. Moreover, X-ray diffraction has become one of the most powerful tools to study the structural properties of nanocomposites, which nowadays receive a great interest for their numerous potential applications.

Texture and residual stress both introduce pronounced anisotropy in the properties of polycrystals. The physical causes for these phenomena are intensively under discussion in the community and offer a pathway to improve our understanding of materials processing.

The availability of micron and sub-micron beams makes possible micro-diffraction and nano-spectroscopy with unprecedented resolution, which is important in nano and surface science as well as in many industrial and environmental issues. Furthermore, such small beams allow one to probe very small sample volumes under extreme conditions of pressure and temperature.

The coherence of synchrotron X-ray beams enables use of phase sensitive techniques. Phase imaging is providing new insight in structures which have limited, or similar, absorption contrast. The development of fast 3D imaging techniques with synchrotron radiation allows real time experiments for example in the field of metal solidification. Diffraction based imaging gives access to 3D crystallographic arrangements of grains in undeformed materials opening vast avenues of research.

Established techniques such as photoemission, absorption and diffraction are taking advantage of the properties of advanced synchrotron radiation sources by improving resolution and detection limits (e.g. in fluorescence X-ray absorption or trace element analysis applied to impurities, defects and dopants or surfaces).

X-ray Free Electron Laser sources are currently in construction in a number of laboratories world-wide. These sources will provide unprecedented possibilities in x-ray science and this symposium aims at discussing their application to materials science.

The proceedings of the symposium will be published in a special issue of Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms by Elsevier.
Location Nice
URL http://www.emrs-strasbourg.com/index.php?option=com_content&task=view&Itemid=134&id=394

Category IUCr sponsored meetings | Symposia
Topics Free-electron laser | Materials