Event Name

Advanced Imaging Techniques For Scanning Electron Microscopy

Start Date 13th Jul 2014
End Date 15th Jul 2014
Description

This Scanning Electron Microscopy (SEM) imaging course is an advanced topics course and provides instruction and hands-on practice for getting the best possible SEM images, especially from difficult samples, or under challenging operating conditions. Signals and image generation, instrument operation, operating variables, image interpretation and applications of SEM will be studied through lectures and hands-on activities. Advanced SEM imaging topics such as very high resolution imaging and low voltage imaging will be covered.

  • Sample preparation for SEM imaging    
  • Optimizing microscopes for imaging
  • Imaging at low vacuum
  • Imaging at low accelerating voltages
  • Very high resolution imaging
  • Image analysis and interpretation
Two sessions available: 13 and 14 July 2014, and 14 and 15 July 2014
Location Westmont, IL
United States
Contact
education@hookecollege.com
URL http://www.hookecollege.com/courses/course.asp?COURSE_ID=127
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Category Training courses
Topics Electron crystallography | Microscopy