Event Name

Combined Analysis Using X-ray and Neutron Scattering by using MAUD software

Start Date 27th Jun 2016
End Date 1st Jul 2016
Description The training will cover many aspects of "Combined Analysis" by X-ray and neutron scattering, ranging from fundamental requirements to technically relevant industrial and academic applications : Diffraction technique - an overview, crystallography Texture Analysis, Residual Stress Analysis, Rietveld analysis, Reflectivity analysis, Phase analysis, Phase and line broadening analysis, The combined solution, XRD and XRF combined analysis, Electron Microscopy.
Location Caen
France
Contact Eric Berthier
ebinel@yahoo.fr
URL http://www.inel.fr/en/news-events/workshop-rietveld-2016
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Category Workshops
Topics Materials | Neutron scattering | Powder diffraction