Event Name


Start Date 16th Nov 2016
End Date 18th Nov 2016

From November 16 to November 18, 2016, the international workshop GISAXS2016 will be held in Hamburg, Germany http://gisaxs2016.desy.de). It is a continuation of the very successful series of several international GISAXS workshops at DESY (in 2005, 2007, 2011, 2013) and the satellite conferences to the SAS conference series in Oxford (in 2009), in Kyoto (in 2012) and in Nice (in 2015). This workshop brings together different communities working in the field of thin films, nanostructures, surfaces and interfaces, to gain insights to the very powerful method of grazing incidence small angle X-ray scattering and related techniques. In keynote and invited lectures the possibilities and new trends in GISAXS and GISANS will be highlighted with a special emphasis on real-time investigations and data analysis. As in all the years, we expect about 100 participants from all over the world.

Keynote and invited lectures will highlight the possibilities and new trends in GISAXS and GISANS.

Poster sessions will allow for a profound discussion among the participants.

This workshop addresses students, experienced researchers, senior scientists working in the field of and exploiting the potentials of GISAXS and GISANS in the area of thin film technology.

The program is divided in two parts: Introductory lectures will be combined with expert lectures by leading expert’s scientists of grazing incidence technology and application. In the second part of the workshop we will on hands-on GISAXS, namely on-line treatment and simulation of GISAXS data. Additionally, we will offer a visit to the new micro-and nano-focus beamline dedicated to GISAXS at the 3rd generation synchrotron radiation source PETRA III.

Location Hamburg
Contact Matthias Kreuzeder
URL http://gisaxs2016.desy.de

Category Workshops
Topics Nanomaterials | Small-angle scattering | Surface studies | Synchrotron radiation