Statistical Descriptors in Crystallography

Topics

• Basic notions
• Uncertainty of measurement
• Refinement
• Refinement on I, |F|² or |F|?
• Defects in the model
• Weighting schemes
  • Weights of averaged intensities
  • Weights based on the model
  • Restraints
  • Enhancing particular features
• Recommendations

Ancillary material

• Preface
• Historical background
• 1989 Report - Abstract and authors
• 1995 Report - Abstract and authors
• References

Glossary of statistical terms

• Accuracy
• Average
• Bayesian
• Bias
• Combined standard uncertainty
• Conditional probability density function
• Correlation
• Covariance
• Cumulative distribution function
• Degrees of freedom
• Deviance
• Deviate
• Durbin-Watson d statistic
• Error
• Estimate
• Estimated standard deviation
• Estimator
• Expected value
• Gaussian
• Goodness of fit
• Maximum likelihood
• Mean
• Measurand
• Measurement
• Model
• Moment
• Normal (Gaussian) probability density function
• Normal probability plot
• Order statistic
• Parameter
• Population
• Precision
• Probability density function
• Random error
• Random variable
• Repeatability
• Reproducibility
• Residual
• Sample
• Scaled deviance
• Standard deviation
• Standard uncertainty
• Systematic error
• Type A evaluation of uncertainty
• Type B evaluation of uncertainty
• Unbiased
• Uncertainty (of measurement)
• Variance
• Variance-covariance matrix
• Weight
• Weighted deviance

Copyright © 1997 International Union of Crystallography