CuK[[alpha]]-RADIATION APPLICATION FOR DETERMINATION OF X-RAY PARAMETERS OF CRYSTALS G. A. Kuznetsova, Irkutsk State University, Irkutsk, Russia

The K[[alpha]]-line doubling of monochromatic X-ray radiation often was the obstacle which carried the certain difficulties and noncontrollable errors in the final results at the X-raying. K[[alpha]]-line monochromatization has been fulfilled according to the modern apparatus possibility which allows to obtain the highintensive lines of characteristic spectrum.Then it was used to solve some structural analysis.

The CuK[[alpha]] X-rayograms had the almost zero background level, which remained constant all through the diffractional angles 2[[theta]] range over 4[[pi]]. Maximum positions were not displaced relative to the weight center of reflection, so measurements were simplified a lot.

The possibility of obtaining of great number of reflections in the certain angular range without replacement X-ray tube allows to construct the electron density crystal projections and determine atom coordinates or their changes depending on the physical factor influence.The diffractional maxima were determined to become more narrow at the experimental projections.The often coincident with maximum of Si tetrahedral oxygen maximum became now more sharp.

On using CuK[[alpha]]-radiation in combination with the second moment-method for the measurement of the crystallite dimension and fine-film polycrystal material microstrain good results were also obtained.According to these results CuK[[alpha]] -radiation would be perspective in X-raying.