Awards and Prizes
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ICDD anounces Awards

The International Centre for Diffraction Data announces the following awards:

McMurdie Award

Winnie Wong-Ng, National Inst. of Standards and Technology, Gaithersburg, MD, USA, has been selected to receive the 2004 McMurdie Award. The award was presented at the 53rd Annual Denver X-ray Conference, Steamboat Springs, CO, USA, August 4, 2004. This award recognizes Dr. Wong-Ng's contributions to the computer-aided evaluation of X-ray powder patterns and editing of the Powder Diffraction FileTM, as well as her work in enhancing the accuracy of powder methods of X-ray crystallography. Named in honor of Howard McMurdie, long time editor of the ICDD Ceramics Subfile, the McMurdie Award is presented every two years for distinguished work, which improves the Powder Diffraction FileTM in its purpose of identifying and characterizing inorganic solids.

J.D. Hanawalt Award

Robert L. Snyder, of Georgia Inst. of Technology, Atlanta, GA, USA has been selected to receive the 2004 J.D. Hanawalt Award for excellence in the field of X-ray powder diffraction. Dr. Snyder will present the Hanawalt Award Lecture entitled, 'The Evolution of Total Pattern Analysis' at the 53rd Annual Denver X-ray Conference in Steamboat Springs, CO, USA, August 4, 2004. The J.D. Hanawalt Award is presented every three years for important, recent contributions to the field of X-ray powder diffraction and phase identification published within the last several years. The award consists of a commemorative plaque, an honorarium, and travel funds to attend the meeting at which the award and lecture will be presented.