IUCr journals

Differential quantitative analysis of background structure in energy-filtered convergent-beam electron diffraction patterns

J. Appl. Cryst. (2010). 43, 280-284 (doi.org/10.1107/S0021889810000749)

[CBED patterns] Two 0±3 eV energy-loss-filtered CBED patterns, (i) and (ii), from the same thickness of single crystal corundum near <001>. A and B are at equivalent locations relative to the zone (crosses), as are C and D. The background oscillations (B and D) mimic the oscillations within the reflections (A and C).

Energy filters have significantly advanced the quantitative interpretation of electron diffraction patterns by elastic scattering theory. They are, however, incapable of removing electrons involved in phonon excitation and those scattered elastically by specimen surface imperfections. Thus, a background in zero loss energy-filtered convergent beam electron diffraction (CBED) patterns remains. It is observed that this background can be separated into diffuse and oscillatory components, the latter mimicking the elastic distribution. A differential treatment of CBED patterns leads to a more complete analysis by elastic scattering theory.

P. N. H. Nakashima and B. C. Muddle