IUCr journals

NIST and Argonne researchers develop new USAXS-XPCS tool at APS

J. Appl. Cryst. (2011). 44, 200-212 (doi.org/10.1107/S0021889810053446)

[Correlation map of dental composite] Correlation coefficient map quantitatively describes how 1D USAXS–XPCS scans from an advanced dental composite sample change during slow cooling from an annealing temperature of 388 K.

Taking advantage of 2D-collimated Bonse-Hart-type crystal optics, NIST and Argonne researchers have developed a new ultra-small-angle X-ray scattering (USAXS)-based X-ray photon correlation spectroscopy (XPCS) measurement technique at the Advanced Photon Source. This technique probes low-frequency equilibrium and nonequilibrium dynamics in optically opaque materials containing prominent features that scatter in a q range between those of dynamical light scattering and conventional XPCS. To date, USAXS-XPCS has been successfully applied to study colloidal suspensions and incipient structural changes in advanced dental composites.

F. Zhang, A. J. Allen, L. E. Levine, J. Ilavsky, G. G. Long and A. R. Sandy