IUCr journals

Versatility of a hard X-ray Kirkpatrick-Baez focus characterized by ptychography

J. Synchrotron Rad. (2013). 20, 490-497 (http://doi.org/mvf)

[Focal wave field]

In the past decade Kirkpatrick-Baez (KB) mirrors have become an increasingly popular tool for efficient focusing of high-power third-generation synchrotron beams. Taking the dedicated nano-imaging setup GINIX (Göttingen Instrument for Nano-Imaging with X-rays) at the P10 beamline of the PETRA III synchrotron in Hamburg, Germany, as an example, the versatility of such a focusing device has been explored. By full characterization of the complex focal wave field using ptychography it is shown how a spatial filter near the focal plane can be used to obtain a nearly Gaussian focus with a smooth far-field intensity distribution. The focal size is shown to be precisely adjustable by variation of the entrance aperture.

K. Giewekemeyer, R. N. Wilke, M. Osterhoff, M. Bartels, S. Kalbfleisch and T. Salditt