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A large-solid-angle X-ray Raman scattering spectrometer

vv5158S. Huotari and co-workers [J. Synchrotron. Rad. (2017), 24, 521-530] describe an end-station for X-ray Raman spectroscopy at beamline ID20 of the European Synchrotron Radiation Facility. The end-station is dedicated to the study of shallow core electronic excitations using non-resonant inelastic X-ray scattering.

X-ray Raman scattering (XRS) spectroscopy is a versatile tool for studying shallow X-ray absorption edges using hard X-rays. It has proven to be an invaluable technique for the study of electronic excitations in a variety of sample systems such as crystals, liquids and gases. Over the past decades, XRS has been applied to solve geoscientific questions by studying shallow core edges under extreme pressure and temperature conditions, follow chemical reactions in situ, and study liquid samples under well defined thermodynamic conditions.

Continue reading this research news story on the IUCr Crystallites blog.