Statistical descriptors in crystallography
Topics
- Basic notions
- Uncertainty of measurement
- Refinement
- Refinement on I, |F|2 or |F|?
- Defects in the model
- Weighting schemes
- Recommendations
Ancillary material
- Preface
- Historical background
- 1989 Report - Abstract and authors
- 1995 Report - Abstract and authors
- References
Glossary of statistical terms
- Accuracy
- Average
- Bayesian
- Bias
- Combined standard uncertainty
- Conditional probability density function
- Correlation
- Covariance
- Cumulative distribution function
- Degrees of freedom
- Deviance
- Deviate
- Durbin-Watson d statistic
- Error
- Estimate
- Estimated standard deviation
- Estimator
- Expected value
- Gaussian
- Goodness of fit
- Maximum likelihood
- Mean
- Measurand
- Measurement
- Model
- Moment
- Normal (Gaussian) probability density function
- Normal probability plot
- Order statistic
- Parameter
- Population
- Precision
- Probability density function
- Random error
- Random variable
- Repeatability
- Reproducibility
- Residual
- Sample
- Scaled deviance
- Standard deviation
- Standard uncertainty
- Systematic error
- Type A evaluation of uncertainty
- Type B evaluation of uncertainty
- Unbiased
- Uncertainty (of measurement)
- Variance
- Variance-covariance matrix
- Weight
- Weighted deviance
© 1989, 1995 International Union of Crystallography
Updated 18th Sept. 1996
These pages are maintained by the Commission Last updated: 15 Oct 2021