ADM

Entered: Tue Jun 26 12:29:38 2001

Operating systems: MS Windows

Type: Binary

Languages:

Distribution: Commercial

Application fields: Characterization; Instrumentation

Bibliography:

Description: Solution including device control, the diffractogram evaluation, qualitative and quantitative phase analysis, indexing, lattice parameter refinement, crystal size evaluation, micro-stress analysis, profile analysis and pattern simulation.

References: http://www.RMSKempten.de/

 



Last updated: 09 May 2011