FULLPAT
Entered: Fri Nov 05 2010
Operating systems: MacOS; MS Windows
Type:
Languages: Microsoft Excel
Distribution: Free
Application fields: Minerals; Powder
Bibliography: Chipera, S. J. & Bish, D. L. (2002). J. Appl. Cryst. 35, 744-749
Description: Quantitative X-ray diffraction methodology that merges the advantages of existing full-pattern fitting methods with the traditional reference intensity ratio (RIR) method. Like the Rietveld quantitative analysis method, it uses complete diffraction patterns, including the background.
Last updated: 15 Oct 2021