Entered: Fri Nov 05 2010

Operating systems: MacOS; MS Windows


Languages: Microsoft Excel

Distribution: Free

Application fields: Minerals; Powder

Bibliography: Chipera, S. J. & Bish, D. L. (2002). J. Appl. Cryst. 35, 744-749

Description: Quantitative X-ray diffraction methodology that merges the advantages of existing full-pattern fitting methods with the traditional reference intensity ratio (RIR) method. Like the Rietveld quantitative analysis method, it uses complete diffraction patterns, including the background.



Last updated: 09 May 2011