GID_SL

Entered: Tue Nov 09 2010

Operating systems: Unix; MS Windows

Type: Binary

Languages:

Distribution: Free

Application fields: Characterization; Diffraction; Materials science; Surface

Bibliography:

Description: Simulates dynamical x-ray diffraction from strained crystals, multilayers, and superlattices. Applicable to any coplanar and non-coplanar Bragg-case geometry. The following structure profiles can be simulated: 1. Normal lattice strains da(z)/a; 2. Crystal polarizabilities x0(z), xh(z); 3. Interface roughness in multilayers (rms).

References: http://sergey.gmca.aps.anl.gov/GID_SL.html

 



Last updated: 09 May 2011