Entered: Mon Nov 22 2010

Operating systems: Unix

Type: Source

Languages: Fortran

Distribution: Free for academic use

Application fields: Diffraction

Bibliography: Campbell, J. W., Hao, Q., Harding, M. M., Nguti, N. D. & Wilkinson, C. (1998). J. Appl. Cryst. 31, 496-502.

Description: X-Window program which carries out the stages of processing Laue diffraction data up to and including the integration of spot intensities. See also INTLDM for the standalone program.



Last updated: 09 May 2011