Entered: Fri Sep 13 2013

Operating systems: MacOS; Unix; MS Windows

Type: Binary

Languages: Java

Distribution: Free

Application fields: Characterization; Chemistry; Diffraction; Materials science; Minerals; Powder; Structure; Structure determination; Phase transitions

Bibliography: Lutterotti, L. (2010). Nuclear Inst. and Methods in Physics Research B, 268, 334-340

Description: MAUD stands for Material Analysis Using Diffraction. It is a general diffraction/reflectivity/fluorescence analysis program mainly based on the Rietveld method, but not limited to. The main features are: Written in Java can run on Windows, MacOSX, Linux, Unix (need Java VM 1.6 or later) Easy to use, every action is controlled by a GUI Works with X-ray, synchrotron, Neutron, TOF, electrons Developed for Rietveld analysis, simultaneous multi spectra and different instruments/techniques supported Ab-initio structure solution integration, from peak finding, indexing to solving Different optimization algorithms available (LS, Evolutionary, Simulated Annealing, Metadynamics) Le Bail fitting Quantitative phase analysis Microstructure analysis (size-strain, anisotropy and distributions included) Texture and residual stress analysis using part or full spectra MEEM and superflip algorithm for Electron Density Maps and fitting Thin film and multilayer aware; film thickness and absorption models Reflectivity fitting by different models, from Parratt (Matrix) to Discrete Born Approximation Works with TEM diffraction images and electron scattering Several data files input formats Works and input images from 2D detectors (image plates, CCD) CIF compliance for input/output; import structures from databases



Last updated: 13 Sep 2013