RADS

Entered: Mon Dec 06 2010

Operating systems: MS Windows

Type: Binary

Languages:

Distribution:

Application fields: Materials science

Bibliography:

Description: Characterization of samples using X-ray rocking curve data, by simulation of the diffracted intensity profile using a dynamic simulation package

References: http://www.jvsemi.com/featured-products/featured-products/rads.html

 



Last updated: 09 May 2011