RADS
Entered: Mon Dec 06 2010
Operating systems: MS Windows
Type: Binary
Languages:
Distribution:
Application fields: Materials science
Description: Characterization of samples using X-ray rocking curve data, by simulation of the diffracted intensity profile using a dynamic simulation package
References: http://www.jvsemi.com/featured-products/featured-products/rads.html
Last updated: 15 Oct 2021