Crystallographic resources

RAYFLEX - ANALYZE

Entered: Mon Dec 06 2010

Operating systems: MS Windows

Type: Binary

Languages:

Distribution: Commercial

Application fields: Scattering; Surface

Bibliography:

Description: rocking curves of simple layer structures, curves of superlattices for 001, 111 and 220 oriented substrates. Part of Seifert package.

References: http://www.ge-mcs.com/en/radiography-x-ray/analytical-x-ray-xrd/software.html



Last updated: 15 Oct 2021