Entered: Tue Dec 21 2010

Operating systems: MS Windows

Type: Binary

Languages: C++

Distribution: Free

Application fields: Powder

Bibliography: Krumm, S. (1996). Mat. Sci. Forum, 228–231, 183–188.

Description: A package for complete profile-analysis of x-ray reflections: profile fitting, single line methods for crystallite-size and strain determinations (including Fourier Methods), multiple line Warren-Averbach analysis, reads almost any X-ray file format, writes many major formats, supports clipboard exchange of results and graphics.



Last updated: 09 May 2011