THE X-RAY STUDY OF THE YSZ/MGO(001) INTERFACE: THE DYNAMICAL APPROACH. Tsai-Sheng Gau* and Shih-Lin Chang*#, *Department of Physics, National Tsing Hua University, Hsinchu 30043, Taiwan, R.O.C., #Synchrotron Radiation Research Center, Hsinchu 30077, Taiwan, R.O.C.

The X-ray dynamical approach is used to describe the interface morphology of YSZ/MgO(001) from the grazing incident X-ray diffraction data. Two surface-normal rod scans, (20l) and (22l), are respectively simulated without any structure modeling. The influences on the rod interference patterns of the complicated structures at the interface are presented by only two parameters, the absolute amplitute and phase of the electric succeptibility. These two parameters are then considered as the fitting parameters for the dynamical simulation.

Three kinds of novel crystallites are found to exist at the interface and the structures of these crystallites are of the c-elongated tetragonal structure, which are believed to be unstable. The thicknesses, occupancies, and lattice constants of these crystallites are also determined. A later measurement of the (22l) rod was taken to confirm the instability of these crystallite structures.