THE EFFECT OF THE GROWTH TEMPERATURE ON THE STRUCTURE OF Co-Cr-Co TRILAYERS. TPA Hase, I Pape, BK Tanner, *SM Thompson, *SM Jordan, J-J Freijo, Physics Department, Durham University, Durham, DH1 3LE, U.K., *Physics Department, York University, Heslington, York, YO1 5DD, U.K., Instituto de Magnetismo Aplicado, Universidad Computense, Spain.

The effect of layer deposition temperature on the structure of a series of Si:Co(200)-Cr(10)-Co(212) trilayers grown by U.H.V. evaporation, has been investigated using grazing incidence x-ray reflectivity and MOKE. Specular and diffuse x-ray scattering studies were undertaken at the Daresbury SRS using wavelengths tuned close to and away from the Cr absorption edge. For the trilayer grown at room temperature, fits to both the specular and diffuse scatter have been possible with the same parameters (h=0.250.05, (=11020), resulting in an accurate model of the surface structure. For samples with layers grown at higher temperatures, an increase in the amount of interdiffusion is evident. MOKE studies indicate that growing the first layer at elevated temperatures results in curves which are significantly different from those obtained from the room temperature sample. Completed trilayers show varying values of the transverse component of magnetisation with a notable lack of anisotropy for the sample grown with all layers hot.