A COMMERCIAL CCD DETECTOR FOR X-RAY DIFFRACTION FULLY IMPLEMENTED ON A THIRD GENERATION SYNCHROTRON SOURCE. James F. Fait, John L. Chambers, and James C. Phillips. Siemens Energy & Automation, Inc. 6300 Enterprise Lane, Madison, WI 53719-1173, U.S.A.. Eric Hovestreydt, Siemens AG, Analytical Systems, D76181 Karlsruhe 21, Germany

Based on experiments performed at SSRL and BNL with the Siemens SMART CCD detector, we have fully adapted the goniometer and detector system for synchrotron radiation use. The following major adaptations were made in the hardware and software:

* w/2[[theta]] axis parallel to polarization direction (horizontal).

* New detector mount with drive for sample to detector distance.

* Fast, consistent shutter.

* Incident beam monitor and correction facilities.

* Polarization correction.

* In-Situ Phosphor change for improved efficiency at different wavelengths.

With this system installed on ID11 at the ESRF, we were able to demonstrate the effectiveness of the SMART system for use at a third generation synchrotron source. Samples were measured with incident beam energies from 8 KeV to 62 KeV, with the results presented here.