X-RAY DIFFRACTION AT NON-AMBIENT TEMPERATURE CONDITIONS. B. Koppelhuber-Bitschnau, F. A. Mautner, Institute of Physical and Theoretical Chemistry, Technical University Graz, 8010 Graz, Austria, and P. Doppler, Anton Paar GmbH, Graz, Austria

Several Cameras for X-ray Diffraction at low and high Temperature range were developed, most features and benefits of the following four Temperature Attachments are presented.

With the HTK 16 High-Temperature Camera investigations in the temperature range from room temperature to 1850 K can be carried out either under vacuum, air or inert gas. The HTK 16 can easily be fit to most available goniometers. Integrated alignment slit allows precise positioning even at high temperatures, the heating filament is optimized for minimum temperature gradient, the linear compensation of the heating filament elongation guarantees for sample position stabilization.

The TTK 450 Low-Temperature Camera can be operated with most of the available goniometers, both horizontal and vertical ones. It permits temperature studies by X-Ray methods at temperatures from 80 to 700 K either under vacuum, air or inert gas.

The XRK X-Ray Reactor Chamber mounted on a goniometer permits studies of solid state and solid state-gas reactions at temperatures from room temperature to approx. 1250 K. The experiments may be carried out either in reduced, inert or oxidizing atmospheres at pressure from approx 1 mbar to 10 bar. No temperature gradients within surface and whole bulk of samples, no condensation of reaction gases because housing thermostatable up to 400 K.

The He-TTK Low Temperature Attachment equipped with a closed cycle Helium cryostat permits temperature studies to be made by X-ray methods at temperatures from approx. 12 to 700 K. The He-TTK can be operated with most of the vertical goniometers available, and is suitable for powders, sheets, single crystals and thin films.