EMAG2018: Applications of Electron Microscopy to Beam Sensitive Materials

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Event Name

EMAG2018: Applications of Electron Microscopy to Beam Sensitive Materials

Start Date 4th Jul 2018
End Date 6th Jul 2018
Description

Themes

  • Low dose electron microscopy techniques
  • Ultra low voltage microscopy
  • Cryo-electron microscopy
  • Environmental, dynamic and time resolved microscopy
  • Innovative data acquisition and processing

These may address topics such as: 

  • Advances in low dose imaging and spectroscopy(SEM/(S)TEM/Ion Beam)
  • Dynamic SEM/(S)TEM. In situ microscopy techniques
  • Tomography
  • Electron diffraction
  • Beam writing
  • Beam-material interaction mechanisms
  • Camera and detector technology
  • Smart collection (e.g. compressed sensing)
  • Low dimensional materials
  • Soft matter and hybrid materials
  • Catalysis
  • Biological and natural materials


Location Coventry
United Kingdom
Contact
conferences@iop.org
URL http://emag2018.iopconfs.org/home
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Category Conferences
Topics Cryo electron microscopy | Electron crystallography | Materials | Microscopy