1st FEI-I2PC Cryo-EM Course on Scipion for Facilities

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Event Name

1st FEI-I2PC Cryo-EM Course on Scipion for Facilities

Start Date 27th Jun 2018
End Date 29th Jun 2018
Description The Instruct Image Processing Center (I2PC) and FEI/ThermoFisher are
organizing the First FEI-I2PC Cryo-EM Course on Scipion
<http://scipion.i2pc.es> *for Facilities*, focused on Facilities needs
in data management and processing and how they can be served by Scipion.

Our Scipion team and collaborators have been working in the last years
in what we call streaming processing. We understand the importance of
having feedback during acquisition and this is precisely what will be
covered in this course. From basic processing like movie alignment and
CTF estimation on the fly, to automatic picking and extraction. Scipion
is equipped with several consensus protocols that might help in your
automated pipeline to screen and select the best micrograph, CTFs or
particles. All with the benefit of Scipion flexibility and ?mix and
match? capabilities. Scipion is also able to gather all the processing
information and present it in a HTML report that could be served over
the web and automatically refreshed. Additionally, Scipion API allows
the integration with your LIMS system. Currently released Scipion 1.2
goes in streaming all the way to particle extraction, and during the
course we will present current work in 2D classification and initial
volume, in collaboration with XMIPP team.

The topic of general pipelines for Single Particle Analysis with Scipion
will also be covered, as it will be Scipion usage on the cloud.
We are targeting a maximum of 20 attendees, and we count with?10
accommodation grants for students and Senior researchers from Instruct

*Ideal attendee profile:* IT/developer person trying to automatically
process CryoEM acquisition data. (SPA)
Location Madrid
Contact Pablo Conesa
URL http://i2pc.es/instruct-i2pc-fei-facility-based-image-processing-for-electron-microscopy-madrid-june-27-29-2018/

Category Training courses
Topics Cryo electron microscopy