Event Name

5th NYU X-Ray Workshop

Start Date 26th Jun 2018
End Date 28th Jun 2018

The aim of this workshop is to promote many aspects of crystallography including diffraction methods, instrumentation and software (with a particular focus on the services and products provided by Bruker). Topics of the workshop will include application of X-ray diffraction in academic research and industry, synchrotron radiaiton, crystallisation methods and structure solution and refinement using TOPAS.

It will also allow networking of researchers in the field, with a confirmed line-up of speakers, and to encourage cooperation between NYU and other organisations.

The number of attendees for certain components of the workshop are limited to below the 50 places available for the general workshop lectures, so early registration is advised.

For more information about registration, please contact Dr. Tony Hu (ch98@nyu.edu).

For more general information, please visit: http://as.nyu.edu/chemistry/research/facilities/xray-diffraction/workshop/2018.html


Location New York, NY
United States
Contact Dr. Tony Hu
URL http://as.nyu.edu/chemistry/research/facilities/xray-diffraction/workshop/2018.html

Category Workshops
Topics Crystal growth | General | Polymorphism | Small-angle scattering | Structural chemistry | Synchrotron radiation