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Results 1 to 10 of 20, sorted by name.


Dr Andras Borbely   András Borbély (Sciences des Materiaux et des Structures, École Nationale Supérieure des Mines de Saint-Étienne, France)
General scientific interests: defects, instrumentation, materials science, residual stress, X-ray diffraction.
Detailed scientific research interests: 3DXRD, dislocation structures, line profile analysis, residual stress & strain, X-ray diffraction microscopy.
Search for papers by Borbély, A. in Crystallography Journals Online | Google Scholar | Pubmed

Dr Marian Cernansky   Marian Cernanský (Dept. of Metal Physics, Institute of Physics, Acad. Sci. Cz. Rep., Czech Republic)
General scientific interests: instrumentation, powder diffraction, X-ray diffraction.
Detailed scientific research interests: deconvolution, line profile analysis, non crystalline material, quantitative phase determination, surfaces.
Search for papers by Cernanský, M. in Crystallography Journals Online | Google Scholar | Pubmed

Dr Prabal Das Gupta   Prabal Das Gupta (School of Material Science and Engineering, Jimma Institute of Technology, India)
General scientific interests: electron microscopy, physical crystallography, Rietveld method, X-ray diffraction.
Detailed scientific research interests: Chemistry & physics of carbonaceous material, Line Broadening & profile shape functions, moment method of Size-Dislocation density determination, Quantitative Phase analysis, Quantitave Phase analysis using Rietveld method, structure-property corelation.
Search for papers by Das Gupta, P. in Crystallography Journals Online | Google Scholar | Pubmed

Dr Robert Delhez   Robert Delhez (Materials Science and Engineering, Delft University of Technology, Netherlands)
General scientific interests: defects, instrumentation, materials science, powder diffraction, X-ray diffraction.
Detailed scientific research interests: line profile analysis / size-strain analysis; handheld X-ray diffractometers.
Search for papers by Delhez, R. in Crystallography Journals Online | Google Scholar | Pubmed

Dr Jeno Gubicza   Jeno Gubicza (Department of Materials Physics, Eötvös Lorand University, Hungary)
General scientific interests: materials science, powder diffraction, X-ray diffraction.
Detailed scientific research interests: nanocrystalline materials, X-ray line profile analysis.
Search for papers by Gubicza, J. in Crystallography Journals Online | Google Scholar | Pubmed

Dr Rodrigo Uchida Ichikawa   Rodrigo Uchida Ichikawa (Materials Science and Technology Center, Nuclear and Energy Research Institute, Brazil)
General scientific interests: data collection and processing, nanomaterials, powder diffraction, Rietveld method, X-ray diffraction.
Detailed scientific research interests: Applied crystallography, Microstructural characterization, Pair distribution function, Rietveld refinement, Total Scattering, Warren-Averbach method, X-ray line profile analysis.
Search for papers by Uchida Ichikawa, R in Crystallography Journals Online | Google Scholar | Pubmed

Dr Takashi Ida   Takashi Ida (Ceramics Research Laboratory, Nagoya Institute of Technology, Japan)
General scientific interests: powder diffraction, Rietveld method, X-ray diffraction, X-ray optics.
Detailed scientific research interests: data analysis, deconvolution, instrument design, lattice parameter refinement, line profile analysis, particle-size measurement.
Search for papers by Ida, T. in Crystallography Journals Online | Google Scholar | Pubmed

Dr Sergey A. Ivanov   Sergey A. Ivanov (Karpov Institute of Physical Chemistry, X-ray Laboratory, 10 Obukha St., K-64, Russia, Russian Federation)
General scientific interests: Rietveld method.
Detailed scientific research interests: Debye Waller factor, ferroelectricity, inorganic compound, line profile analysis, phase transition, real structure, thermal expansion, X-ray powder diffraction.
Search for papers by Ivanov, S.A. in Crystallography Journals Online | Google Scholar | Pubmed

Dr V. Jayan   V. Jayan (Nano, Applied Coating Materials & XRD, NETRA, NTPC Ltd, India)
General scientific interests: alloys, electron diffraction, electron microscopy, Rietveld method, X-ray diffraction.
Detailed scientific research interests: Line profile analysis, Nano materials,, Phase transformation studies in metals,, XRD phase analysis etc..
Search for papers by Jayan, V. in Crystallography Journals Online | Google Scholar | Pubmed

 Michal Kolega   Michal Kolega (X-ray Laboratory, Inst. of Technology and Reliability, West Bohemia U., Veleslavínova 11, Plzeň, 301 04, Czech Republic)
Detailed scientific research interests: amorphization, coating, diffraction, lattice distortion, line broadening, nitride, paracrystal, profile analysis, PVD, strain, thin film, X-ray fluorescence spectroscopy.
Search for papers by Kolega, M. in Crystallography Journals Online | Google Scholar | Pubmed


List from result number:  1 
International Union of Crystallography

Scientific Union Member of the International Science Council (admitted 1947). Member of CODATA, the ISC Committee on Data. Partner with UNESCO, the United Nations Educational, Scientific and Cultural Organization in the International Year of Crystallography 2014.

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