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Dr Bhabani Sankar Acharya   Bhabani Sankar Acharya (C.V.Raman College of Engineering, Bidyanagar, Mahura, Janla, India)
General scientific interests: electron diffraction, electron microscopy, Rietveld method, X-ray diffraction, XAFS.
Detailed scientific research interests: databases, defects, high-temperature XRD, qualitative and quantitative phase determination by powder diffraction, Rietveld method of profile analysis.
Search for papers by Acharya, B.S. in Crystallography Journals Online | Google Scholar | Pubmed

Dr Prabal Das Gupta   Prabal Das Gupta (School of Material Science and Engineering, Jimma Institute of Technology, India)
General scientific interests: electron microscopy, physical crystallography, Rietveld method, X-ray diffraction.
Detailed scientific research interests: Chemistry & physics of carbonaceous material, Line Broadening & profile shape functions, moment method of Size-Dislocation density determination, Quantitative Phase analysis, Quantitave Phase analysis using Rietveld method, structure-property corelation.
Search for papers by Das Gupta, P. in Crystallography Journals Online | Google Scholar | Pubmed

Dr Eric Dooryhee   Eric Dooryhee (National Synchrotron Light Source II (NSLS II), Brookhaven National Laboratory (BNL), USA)
General scientific interests: data collection and processing, materials science, Rietveld method, X-ray diffraction, X-ray optics.
Detailed scientific research interests: - diffraction peak profile analysis, - in charge of the High Energy Powder Diffraction project beamline at NSLS II, - microstructure of epitaxial thin films and superlattices of perovskite oxides., - Rietveld refinement, simulated annealing, rigid body method, - Synchrotron techniques in Art and Archaeometry.
Search for papers by Dooryhee, E. in Crystallography Journals Online | Google Scholar | Pubmed

Dr Rodrigo Uchida Ichikawa   Rodrigo Uchida Ichikawa (Materials Science and Technology Center, Nuclear and Energy Research Institute, Brazil)
General scientific interests: data collection and processing, nanomaterials, powder diffraction, Rietveld method, X-ray diffraction.
Detailed scientific research interests: Applied crystallography, Microstructural characterization, Pair distribution function, Rietveld refinement, Total Scattering, Warren-Averbach method, X-ray line profile analysis.
Search for papers by Uchida Ichikawa, R in Crystallography Journals Online | Google Scholar | Pubmed

Dr EMIL INDREA   EMIL INDREA (Material Science , NATIONAL INSTITUTE for SCIENCE and DEVELOPMENT of ISOTOPIC and MOLECULAR TECHNOLOGIES, Romania)
General scientific interests: catalysis, computer graphics, computing, data collection and processing, databases, defects, direct methods, disorder, drug design, dynamical diffraction, ferroelectrics, glasses, hydrogen bonding, inorganic compounds, materials science, metalloproteins, metals, neutron scattering, organometallic compounds, oxides, physical crystallography, polymers, powder diffraction, Rietveld method, semiconductors, small-angle scattering, superconductors, synchrotron radiation, thin films, X-ray diffraction, XAFS, zeolites.
Detailed scientific research interests: - microstructural investigations, - structure of, - structure of amorphous materials by, -EXAFS absorption spectroscopy by, -Invited university lecturer in, alloys, and Rietveld method, by X-ray diffraction, by X-ray profile Fourier analysis, EXAFS, intermetallic compounds, Reverse Monte-Carlo simuulation, solid state physics, supported metal catalysts, synchrotron radiation facility, X-ray RDF, XANES.
Search for papers by INDREA, E in Crystallography Journals Online | Google Scholar | Pubmed


International Union of Crystallography

Scientific Union Member of the International Science Council (admitted 1947). Member of CODATA, the ISC Committee on Data. Partner with UNESCO, the United Nations Educational, Scientific and Cultural Organization in the International Year of Crystallography 2014.

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