Results 1 to 2 of 2, sorted by name.
|Bhabani Sankar Acharya (C.V.Raman College of Engineering, Bidyanagar, Mahura, Janla, India) |
General scientific interests: electron diffraction, electron microscopy, Rietveld method, X-ray diffraction, XAFS.
Detailed scientific research interests: databases, defects, high-temperature XRD, qualitative and quantitative phase determination by powder diffraction, Rietveld method of profile analysis.
|Search for papers by Acharya, B.S. in Crystallography Journals Online | Google Scholar | Pubmed|
|Anna Moliterni (Institute of Crystallography - CNR, Via Amendola, 122/O, Italy) |
General scientific interests: computing, data collection and processing, direct methods, powder diffraction, structure determination.
Detailed scientific research interests: Ab-initio structure determination by powder diffraction data, Computational Crystallography, Qualitative phase analysis, Quantitative phase analysis, Rietveld refinement, Structure determination and refinement by single crystal diffraction data.
|Search for papers by Moliterni, A. in Crystallography Journals Online | Google Scholar | Pubmed|
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