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10 citations found for Kimoto,

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Neutron-irradiated damage of highly oriented pyrolytic graphite crystals was examined by means of X-ray diffraction and high-resolution high-voltage transmission electron microscopy in order to investigate the local structural disordering.

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The differential electron yield (DEY)-EXAFS method using a multichannel electron energy analyzer is presented. DEY-EXAFS provides a specific absorption-edge spectrum with no other edges within the EXAFS oscillation (N K-edge for silicon nitride in this study), enabling local structure analysis with Fourier transformation.

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The surface-sensitive performance of extended X-ray absorption fine structure (EXAFS) spectroscopy via differential electron yield is demonstrated using a thickness-defined SiO2 (12.4 nm)/Si sample. The Si K-edge EXAFS spectrum suggests an analysis depth of approximately 4.2 nm, and the derived first nearest neighbor (Si—O) distance was 1.63 Å, which is within the reported values of SiO2.

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Simulation-aided XAS analysis can distinguish between the N-containing sites at the SiO2/SiC(0001) interface. The N-containing sites could be the substitutional C site at the interface of the NO-annealed sample and the interstitial site in the interior of SiC for the NO–POA-annealed sample.

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The crystallization and preliminary X-ray diffraction analysis of the catalytic domains of cell-surface-expressed chitinase ChiW from Paenibacillus sp. strain FPU-7 are reported.

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The title compound, 5,5,8,8-tetrafluoro-6-methoxy-5,8-dihydroquinoline, C10H7F4NO, has a planar 1,4-cyclohexadiene ring with a maximum deviation of 0.019 (3) Å from planarity, The C(6)=C(7) double bond [1.327 (4) Å] is shorter than the C(9)=C(10) double bond [1.382 (4) Å], the latter value being consistent with that found in pyridine rings.

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Acta Cryst. (2002). A58, c251
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Acta Cryst. (2008). A64, C510
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Acta Cryst. (2008). A64, C524
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