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6 citations found for Kuwahara,

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Acta Cryst. (2008). A64, C510
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The design and performance of the high-brilliance XAFS facility at BL10XU of SPring-8, aimed at rapid and sensitive measurement of X-ray absorption fine structure, is reported.

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Surface-sensitive X-ray absorption fine structure (XAFS) with sub-monolayer sensitivity based on grazing-incidence fluorescence detection is reported. The efficiency of fluorescence detection increased by more than two orders of magnitude by combining a multipole wiggler with a multi-element Si(Li) solid-state detector. The capability of the present technique for structural studies of surfaces and buried interfaces in the hard X-ray region was demonstrated by As K-edge XAFS studies of the InP(001) surface exposed to AsH3 flow. The results indicated that ~0.1 monolayer As atoms are incorporated into the surface replacing the P atoms.

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A scanning tunneling microscope for in situ experiments under the irradiation of a highly brilliant hard-X-ray microbeam has been developed. Scanning tunneling microscopy images were successfully obtained at atomic resolution and a modification of the tip-current spectra was obtained for Ge nano-islands on a clean Si(111) surface by changing the incident photon energy across the Ge absorption edge.


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