Entered: Fri Dec 24 2010
Operating systems: MS Windows
Application fields: Minerals; Powder
Description: Tool for displaying and analyzing two-dimensional (2D) X-ray diffraction patterns collected using a diffractometer equipped with a 2D or area detector. Can find the direct beam or the pattern center even when detector is at a angle different from zero. It can calculated different types of scans, also work in batch mode to analyse many data files.