United States
10th LEEM/PEEM workshop
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In Monterey, CA
LEEM-PEEM is a biennial meeting reviewing the status of LEEM, PEEM, SPLEEM, XPEEM and related techniques. The meeting promotes and disseminates applications of cathode lens microscopy to a broad audience of interested scientists.
The workshop highlights the most recent scientific advances as well as instrumental developments. Topics will cover surfaces, thin films, organic films, surface chemistry, magnetism, time resolved methods, instrumental advances and novel applications of LEEM and PEEM to other subject areas.
Contact:
Jason Templer
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