7th Telematic School: Structural Analysis by X-ray Diffraction and Contributions of Total Diffusion to Structure Determination

This school will focus on the basics of of crystalline structure determination, by use of X-ray diffraction, and on the relevant refinement and analysis methods used in such determination.

The primary languages of the school are both English and French.

Registration deadline: 10th June 2017.

For more information and registration, visit:

http://crm2.univ-lorraine.fr/lab/fr/education/congres/nancy2017/informations-generales/