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8th Workshop on Combined Analysis In XRD By Using MAUD Software

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In Caen

Chemical crystallography Computing General Microscopy Neutron scattering

This workshop will take place in Caen, France. Â The training will cover many aspects of "Combined Analysis" by X-ray and neutron scattering ranging from fundamental requirements to technically relevant industrial and academic applications, including diffraction techniques, phase analysis, electron microscopy and the use of MAUD software.

The number of places on the workshop is limited to 30. Â Registration deadline is 30th June 2017.

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Contact:
Eric Berthier
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