Powder Diffraction & Rietveld Refinement School

Topics to be covered will include:

• Data collection strategies for X-ray and neutron diffraction
• Constant-wavelength and time-of-flight diffraction
• Modelling peak shapes (including microstructure analysis)
• Indexing powder patterns
• Rietveld, Le Bail and Pawley fitting methods
• X-ray and neutron combined Rietveld refinements
• Restrained refinements
• Rigid body refinements
• A number of more specialised and advanced optional topics (ab initio structure solution, parametric and symmetry-mode refinements)