France
Combined Analysis in XRD by using MAUD software: 9th Workshop
| - |
In Caen
The training will cover many aspects of "Combined Analysis" by X-ray and neutron scattering, ranging from fundamental requirements to technically relevant industrial and academic applications : Diffraction technique - an overview, crystallography Texture Analysis, Residual Stress Analysis, Rietveld analysis, Reflectivity analysis, Phase analysis, Phase and line broadening analysis, The combined solution, XRD and XRF combined analysis, Electron Microscopy, Using MAUD software.
For more information about the workshop, please contact us:
Daniel Chateigner Professor, CRISMAT Laboratory, Caen, France: scientific coordinator, [email protected]
Eric Berthier, THERMO FISHER SCIENTIFIC company, INEL brand: organization coordinator, [email protected]
