5th NYU X-Ray Workshop

The aim of this workshop is to promote many aspects of crystallography including diffraction methods, instrumentation and software (with a particular focus on the services and products provided by Bruker). Topics of the workshop will include application of X-ray diffraction in academic research and industry, synchrotron radiaiton, crystallisation methods and structure solution and refinement using TOPAS.

It will also allow networking of researchers in the field, with a confirmed line-up of speakers, and to encourage cooperation between NYU and other organisations.

The number of attendees for certain components of the workshop are limited to below the 50 places available for the general workshop lectures, so early registration is advised.

For more information about registration, please contact Dr. Tony Hu ([email protected]).

For more general information, please visit:Â http://as.nyu.edu/chemistry/research/facilities/xray-diffraction/workshop/2018.html

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