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Schools

Italy

MAUD 2018

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In Trento

Applied crystallography Characterisation of materials Computing Data analysis Electron crystallography Neutron scattering Powder diffraction Synchrotron radiation X-ray fluorescence

The Maud 2018 international school will cover many aspects of the “Combined Analysis” by X-ray, neutron and electron scattering and X-ray fluorescence applied to material science, ranging from fundamental requirements to technically relevant industrial and academic applications.Â
The aim is to bring together participants from various fields of both the academic and non-academic world and give them the necessary information and tools to be able to characterize their own samples using the combined analysis method and the software MAUD.Â
XRD, XRF and electron microscopy equipment available at the Dipartimento Ingegneria Industriale (DII) and Fondazione Bruno Kessler (FBK) will be used to demonstrate technical aspects and to support the theoretical and practical issues of this course.

Contact:
Luca Lutterotti
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