10th Workshop _ Combined Analysis in XRD by using MAUD software

The training will cover many aspects of "Combined Analysis" by X-ray and neutron scattering, ranging from fundamental requirements to technically relevant industrial and academic applications : Diffraction technique - an overview, crystallography Texture Analysis, Residual Stress Analysis, Rietveld analysis, Reflectivity analysis, Phase analysis, Phase and line broadening analysis, The combined solution, XRD and XRF combined analysis, Electron Microscopy, Using MAUD software.