Technical Aspects of Synchrotron X-ray and Neutron Measurements for Diffraction Microstructure Imaging

Technical Aspects of Synchrotron X-ray and Neutron Measurements for Diffraction Microstructure Imaging

Organizing Committee:

• Thien Phan: Chair, NIST ([email protected])
• Darren Pagan, CHESS ([email protected])
• Ulrich Lienert, DESY ([email protected])
• Adam Creuziger, NIST ([email protected])

Description:

The workshop will be focused on the communication and discussion of technical aspects of synchrotron X-ray- and neutron-based microstructural characterization techniques associated with diffraction microstructure imaging in an interactive setting. We will cover the latest developments on data acquisition, management, and reconstruction; sample environments; and a dedicated session focused on support of advanced manufacturing. Discussion sections will focus on the development of physical and software standards and the building of an IUCr commission for this research community.

Day 1: Wednesday, July 15 (start 10 AM EST)

Workshop Introduction (10 min.): Darren Pagan / Adam Creuziger / Ulrich Lienert Speaker Session (30 min. each, 60 min. total): In-situ and Ex-situ quantification of advanced manufacturing process/materials • Fan Zhang, NIST â€" “From Storage Ring to Manufacturing Prosperity: Applications of Synchrotron and Neutron Research in Promoting Advanced Manufacturing” • Tao Sun, UVA â€" “In situ/operando measurement of critical structure parameters in metal additive manufacturing using high-speed synchrotron x-ray imaging” Update Session (10 min. each, 75 min. max): Beamline updates • Jon Wright, ESRF â€" “News from ID11 at the ESRF” • Ulrich Lienert, DESY â€" “Grain resolved diffraction at the PETRA III P07 and P21.2 beamlines” • Peter Kenesei, APS â€" “High-energy X-ray Microscopy Beamlines Instrumentation Developments at the APS” • Jon Tischler, APS â€" “Status of using micro-diffraction at < 500 nm at the APS” • Thomas Wroblewski, HZG â€" “Energy dispersive diffraction imaging” • Carsten Detlefs, ESRF â€" “ID06, the ESRF Dark-Field X-ray microscopy beamline is now open for general user proposals” Break (15 min.) Discussion (60 min.): Physical Standardsâ€" led by Jun-Sang Park, APS

Day 2: Thursday, July 16 (start 10 AM EST)

Daily Introduction (5 min.): Darren Pagan / Adam Creuziger / Ulrich Lienert Speaker Session (30 min. each, 90 min. total): New Data Reconstruction Methods • Johan Hektor, Lund University â€" “Novel methods for reconstructing strain fields from scanning 3DXRD data” • Kelly Nygren, CHESS â€" “Leveraging far-field and near-field HEDM data to efficiently reconstruct • intragranular orientation fields” • Peter Reischig, InnoCryst â€" “Three-dimensional sub-grain mapping of lattice strains and orientations in polycrystals” Update Session (10 min. each, 60 min. max): Codebase updates • Bob Suter, CMU â€" “New Dimensions in HEDM” • Hemant Sharma, APS â€" “Data driven microstructure reconstruction” • Joel Bernier, LLNL â€" “Updates to the HEXRD Software Library” • Hamid Abdolvand, Western Ontario â€" “A tool box for post-processing 3D-XRD data and reconstructing finite element input files” • Henri Proudhon, PSL University - MINES ParisTech â€" “Towards a data platform for the mechanics of microstructures combining experiments and simulations” Break (15 min.) Discussion (60 min.): Code Standards â€" led by Jette Oddershede, XNOVO

Day 3: Friday, July 17 (start 10 AM EST)

Daily Introduction (5 min.): Darren Pagan / Adam Creuziger / Ulrich Lienert Speaker Session (30 min. each, 60 min. total): New Instrumentation and Sample Environments • Paul Shade, AFRL â€" “Advanced In Situ Loading Environments for Synchrotron X-ray Diffraction Experiments” • Ashley Bucsek, U. Michigan â€" “Studying Phase Transformations and Twinning in Metals with Dark-Field X-ray Microscopy” Update Session (10 min. each, 75 min. max): In-Situ Measurements • Matthew Miller, CHESS â€" “The Materials Solution Network at CHESS (MSN-C) - a new paradigm for supporting military and industrial research” • Mustafacan Kutsal, DTU â€" “Update on high resolution 3DXRD at ESRF” • Lianyi Chen, Wisconsin â€" “Quantitatively revealing the dynamics and mechanisms of metal additive manufacturing processes by high-speed synchrotron x-ray imaging and diffraction” • Sven Vogel, LANL â€" “TBD” • Yunhui Chen, University College London â€" “Understanding Directed Energy Deposition Additive Manufacturing Process using In situ and Operando X-ray Imaging and Diffraction” • Sébastien Merkel, Université de Lille, France â€" “TIMEleSS tools: a toolbox for high pressure multigrain diffraction experiments” Break (15 min.) Discussion (60 min.): IUCr Commission Update â€" led by Darren Pagan, CHESS Close-out (10 min.)