France
CrystElec 2021
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In Grenoble
The school focuses on the determination of structures and microstructures at the nanoscale by electron diffraction in a transmission electron microscope (TEM). It relates in particular to recent developments associated with the use of new techniques for acquiring and / or analyzing data such as precession, tomography and orientation mapping. Convergent beam symmetry analysis methods will also be presented.
Contact:
Pascal Roussel
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